Patent Assignment
Reel/Frame 046668/0651
Assignment of Assignor's Interest
Recorded: 2018-08-22
Pages: 6
Assignors
HOOGENBOOM, JACOB PIETER
Executed: 2018-06-13
HAMARAT, NALAN LIV
Executed: 2018-06-21
KRUIT, PIETER
Executed: 2018-06-13
Assignee
DELMIC B.V.
THIJSSEWEG 11, DELFT, 2629, NETHERLANDS
Covered Property
(1)
Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.