IP Library Assignment 051893/0040
Patent Assignment
Reel/Frame 051893/0040

Assignment of Assignor's Interest

Recorded: 2020-02-21 Pages: 5
Assignor
DELMIC B.V.
Executed: 2020-02-20
Assignee
DELMIC IP B.V.
KANAALWEG 4, DELFT, 2628 EB, NETHERLANDS
Covered Properties (5)
Inspection Apparatus and Replaceable Door for a Vacuum Chamber of Such an Inspection Apparatus and a Method for Operating an Inspection Apparatus
Patent: 8,895,921 →
Application: 13/809,685 →
Publication: US 2013/0200262
Integrated Optical and Charged Particle Inspection Apparatus
Patent: 9,715,992 →
Application: 14/390,095 →
Publication: US 2015/0108350
Integrated Optical and Charged Particle Inspection Apparatus
Patent: 9,378,921 →
Application: 14/428,163 →
Publication: US 2015/0262784
Method and Apparatus for Determining a Density of Fluorescent Markers in a Sample
Application: 15/116,788 →
Publication: US 2016/0377544
Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope
Application: 15/328,439 →
Publication: US 2017/0221675
Related Assignments (5)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 29, 2013
From: KRUIT, PIETER; HOOGENBOOM, JACOB PIETER; ZONNEVYLLE, AERNOUT CHRISTIAAN
To: DELMIC B.V.
Reel/Frame 030308/0093 →
Assignment of Assignor's Interest Aug 13, 2015
From: HOOGENBOOM, JACOB P; ZONNEVYLLE, AERNOUT C; KRUIT, PIETER; NARVAEZ-GONZALEZ, ANGELA C
To: DELMIC B.V.
Reel/Frame 036320/0818 →
Assignment of Assignor's Interest Jan 21, 2016
From: HOOGENBOOM, JACOB PIETER; KRUIT, PIETER; LIV, NALAN; ZONNEVYLLE, AERNOUT CHRISTIAAN
To: DELMIC B.V.
Reel/Frame 037540/0677 →
Assignment of Assignor's Interest Dec 7, 2016
From: HOOGENBOOM, JACOB PIETER; KRUIT, PIETER
To: DELMIC B.V.
Reel/Frame 040594/0688 →
Assignment of Assignor's Interest Aug 22, 2018
From: HOOGENBOOM, JACOB PIETER; HAMARAT, NALAN LIV; KRUIT, PIETER
To: DELMIC B.V.
Reel/Frame 046668/0651 →