IP Library Assignment 046797/0485
Patent Assignment
Reel/Frame 046797/0485

Assignment of Assignor's Interest

Recorded: 2018-08-14 Pages: 2
Assignor
HOELZLWIMMER, FRANZ
Executed: 2018-08-03
Assignee
SILTRONIC AG
HANNS-SEIDEL-PLATZ 4, MUNICH, 81737, GERMANY
Covered Property (1)
Method for the Vapour Phase Etching of a Semiconductor Wafer for Trace Metal Analysis
Application: 16/075,408 →
Publication: US 2019/0051534
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Jun 30, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 056719/0881 →
Corrective Assignment to Correct the Date of the Change of Address from 03/12/2020 to 12/03/2020 Previously Recorded at Reel: 056719 Frame: 0881. Assignor(S) Hereby Confirms the Assignment. Jul 1, 2021
From: SILTRONIC AG
To: SILTRONIC AG
Reel/Frame 057561/0451 →