IP Library › Assignment 046858/0107
Patent Assignment
Reel/Frame 046858/0107

Assignment of Assignor's Interest

Recorded: 2018-09-12 Pages: 5
Assignors
SCHWARZBAND, ISHAI
Executed: 2018-06-20
AVNIEL, YAN
Executed: 2018-06-20
KHRISTO, SERGEY
Executed: 2018-06-20
BARAM, MOR
Executed: 2018-06-20
LEVI, SHIMON
Executed: 2018-06-20
GIRMONSKY, DORON
Executed: 2018-06-25
KRIS, ROMAN
Executed: 2018-06-20
Assignee
APPLIED MATERIALS ISRAEL LTD.
9 OPPENHEIMER STREET, PARK RABIN, REHOVOT, 76705, ISRAEL
Covered Property (1)
Measuring Height Difference in Patterns on Semiconductor Wafers
Application: 15/982,918 →
Publication: US 2018/0336675