Patent Assignment
Reel/Frame 046873/0452
Assignment of Assignor's Interest
Recorded: 2018-09-14
Pages: 4
Assignee
OMRON CORPORATION
801, MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU, SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO-SHI,, KYOTO, 600-8530, JAPAN
Covered Property
(1)
Defect Inspection Apparatus, Defect Inspection Method, and Non-Transitory Computer Readable Medium