Patent Assignment
Reel/Frame 047534/0968
Assignment of Assignor's Interest
Recorded: 2018-11-18
Pages: 6
Assignors
IRIE, YOUSUKE
Executed: 2018-07-31
INOUE, HIROTSUGU
Executed: 2018-07-31
TOKUNAGA, SHOGO
Executed: 2018-07-25
KUROKAWA, YU
Executed: 2018-07-31
NIIOKA, TAKUYA
Executed: 2018-08-01
Assignee
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
1-61, SHIROMI 2-CHOME, CHUO-KU, OSAKA-SHI, OSAKA, 540-6207, JAPAN
Covered Property
(1)
Thickness Measurement Method, Thickness Measurement Device, Defect Detection Method, and Defect Detection Device