Patent Assignment
Reel/Frame 047904/0926
Assignment of Assignor's Interest
Recorded: 2019-01-04
Pages: 5
Assignors
LEE, JAE SEOL
Executed: 2018-12-19
HONG, KI OCK
Executed: 2018-12-19
JEONG, HAE SEONG
Executed: 2018-12-19
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Test Apparatus, Test System Including Test Apparatus, Test Method Using Test Apparatus and Test System, and Method of Manufacturing Integrated Circuit