Patent Assignment
Reel/Frame 047943/0647
Assignment of Assignor's Interest
Recorded: 2019-01-09
Pages: 5
Assignors
TSAI, CHUN HUNG
Executed: 2018-09-21
CHEN, HSUAN YU
Executed: 2018-09-21
HU, IAN
Executed: 2018-09-21
SHIH, MENG-KAI
Executed: 2018-09-21
TARNG, SHIN-LUH
Executed: 2018-09-24
Assignee
ADVANCED SEMICONDUCTOR ENGINEERING, INC.
26 CHIN 3RD ROAD, NANTZE EXPORT PROCESSING ZONE, KAOHSIUNG, TAIWAN
Covered Property
(1)
Apparatus and Method for Measuring Warpage