Patent Assignment
Reel/Frame 048066/0471
Assignment of Assignor's Interest
Recorded: 2019-01-11
Pages: 7
Assignors
CHOI, JI-YOUNG
Executed: 2018-12-14
ZHAN, ZHAN
Executed: 2019-01-08
KIM, MIN-SEOB
Executed: 2018-12-14
KIM, JU-HYUN
Executed: 2018-12-14
KANG, SUNG-GUN
Executed: 2018-12-14
RHEE, HWA-SUNG
Executed: 2018-12-14
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Detecting Failure of a Semiconductor Device