IP Library › Assignment 048204/0942
Patent Assignment
Reel/Frame 048204/0942

Assignment of Assignor's Interest

Recorded: 2019-01-31 Pages: 2
Assignors
KIM, KANG SAN
Executed: 2019-01-24
LEE, JAE DEOG
Executed: 2019-01-24
Assignee
SK SILTRON CO., LTD.
53 IMSU-RO, GUMI-SI, GYEONGSANGBUK-DO, 39386, KOREA, REPUBLIC OF
Covered Property (1)
Apparatus and Method for Measuring Particle on Surface of Wafer
Application: 16/263,373 →
Publication: US 2020/0158660