Patent Assignment
Reel/Frame 048249/0828
Assignment of Assignor's Interest
Recorded: 2019-02-06
Pages: 3
Assignor
KANEKO, YASUHIKO
Executed: 2018-11-09
Assignee
FUJIFILM CORPORATION
26-30, NISHIAZABU 2-CHOME, MINATO-KU, TOKYO, 106-8620, JAPAN
Covered Property
(1)
Defect Inspection Device, Defect Inspection Method, and Program