Patent Assignment
Reel/Frame 048534/0447
Assignment of Assignor's Interest
Recorded: 2019-03-07
Pages: 11
Assignors
SASANO, NAOYA
Executed: 2019-02-04
TERANISHI, HIROTADA
Executed: 2019-02-04
SAKAI, TAKAHIRO
Executed: 2019-02-04
CHOI, SI-HUN
Executed: 2019-02-18
Assignee
OMRON CORPORATION
801, MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU, SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO-SHI, KYOTO, 600-8530, JAPAN
Covered Property
(1)
Probe Pin, Inspection Jig, Inspection Unit and Inspection Device