IP Library Assignment 049016/0226
Patent Assignment
Reel/Frame 049016/0226

Assignment of Assignor's Interest

Recorded: 2019-04-29 Pages: 3
Assignors
SHIGETO, KUNJI
Executed: 2019-03-04
YAMASHITA, MITSUGU
Executed: 2019-03-04
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Sample Observation Method Using Superimposed Comparison Image Display
Application: 16/345,520 →
Publication: US 2019/0279838
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052398/0249 →