Patent Assignment
Reel/Frame 049705/0610
Assignment of Assignor's Interest
Recorded: 2019-07-09
Pages: 7
Assignors
HUH, IN
Executed: 2019-01-09
PARK, MIN CHUL
Executed: 2019-01-09
LEE, TAE HO
Executed: 2019-01-09
JEONG, CHANG WOOK
Executed: 2019-01-09
HWANG, CHAN YOUNG
Executed: 2019-01-21
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Detecting Defects in Semiconductor Device