Patent Assignment
Reel/Frame 049729/0461
Assignment of Assignor's Interest
Recorded: 2019-07-11
Pages: 8
Assignors
SAVCHENKO, KIRILL
Executed: 2019-02-05
ASBAG, ASSAF
Executed: 2019-05-26
COHEN, BOAZ
Executed: 2019-02-05
Assignee
APPLIED MATERIAL ISRAEL, LTD.
9 OPPENHEIMER STREET, REHOVOT, 7670109, ISRAEL
Covered Property
(1)
Method of Classifying Defects in a Semiconductor Specimen and System Thereof