Patent Assignment
Reel/Frame 049943/0600
Assignment of Assignor's Interest
Recorded: 2019-08-02
Pages: 3
Assignor
YOSHINO, KIMINORI
Executed: 2019-07-18
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-0023, JAPAN
Covered Property
(1)
Semiconductor Defect Inspection Apparatus and Semiconductor Defect Inspection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.