Patent Assignment
Reel/Frame 050716/0405
Assignment of Assignor's Interest
Recorded: 2019-10-15
Pages: 6
Assignors
INOUE, HIROMU
Executed: 2019-09-18
HIRANO, RYOICHI
Executed: 2019-09-13
SHIRATSUCHI, MASATAKA
Executed: 2019-09-18
OGAWA, RIKI
Executed: 2019-09-19
Assignee
NUFLARE TECHNOLOGY, INC.
8-1, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-8522, JAPAN
Covered Property
(1)
Multiple Electron Beam Inspection Apparatus and Multiple Electron Beam Inspection Method