IP Library Assignment 050860/0865
Patent Assignment
Reel/Frame 050860/0865

Assignment of Assignor's Interest

Recorded: 2019-10-30 Pages: 3
Assignors
TAKANO, SHOJI
Executed: 2019-10-28
MATSUDA, FUMIHIKO
Executed: 2019-10-28
NARISAWA, YOSHIHIKO
Executed: 2019-10-28
Assignee
NIPPON MEKTRON, LTD.
1-12-15, SHIBA-DAIMON, MINATO-KU, TOKYO, 105-8585, JAPAN
Covered Property (1)
Probe Device, Electrical Inspection Apparatus, and Electrical Inspection Method
Application: 16/668,093 →
Publication: US 2020/0166564
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 26, 2025
From: NIPPON MEKTRON, LTD.
To: MEKTEC CORPORATION
Reel/Frame 072961/0045 →