Patent Assignment
Reel/Frame 051161/0750
Assignment of Assignor's Interest
Recorded: 2019-12-03
Pages: 3
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Charged Particle Beam Device and Sample Thickness Measurement Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.