Assignment of Assignor's Interest

Recorded: 2019-12-18 Pages: 6

Assignors

YOSHINO, TAKATOSHI

Executed: 2019-12-13

ARMSTRONG, DAVID

Executed: 2019-12-16

LIU, JINLEI

Executed: 2019-12-09

CHEN, TSE-KUN

Executed: 2019-12-10

Assignee

ADVANTEST CORPORATION

1-6-2, MARUNOUCHI, CHIYODA-KU, TOKYO, 100-0005, JAPAN

Covered Property (1)

Device Under Test Temperature Synchronized with Test Pattern

Application: 16/138,029 →

Publication: US 2019/0086468

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.