Patent Assignment
Reel/Frame 051679/0860
Assignment of Assignor's Interest
Recorded: 2020-01-31
Pages: 4
Assignors
SHIRATSUCHI, MASATAKA
Executed: 2020-01-21
OGAWA, RIKI
Executed: 2020-01-21
INOUE, HIROMU
Executed: 2020-01-21
Assignee
NUFLARE TECHNOLOGY, INC.
8-1, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-8522, JAPAN
Covered Property
(1)
Multiple Electron Beam Inspection Apparatus and Multiple Electron Beam Inspection Method