IP Library › Assignment 051858/0520
Patent Assignment
Reel/Frame 051858/0520

Assignment of Assignor's Interest

Recorded: 2020-02-19 Pages: 3
Assignors
MURAKOSHI, KENICHI
Executed: 2018-12-12
YOSHIKAWA, KIMITSUGU
Executed: 2018-12-12
ISHIDA, TATSUYA
Executed: 2018-12-12
Assignee
SHARP KABUSHIKI KAISHA
1, TAKUMI-CHO, SAKAI-KU, SAKAI CITY, OSAKA, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and Withstand Voltage Test Method
Application: 16/794,639 →
Publication: US 2020/0266157
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 11, 2020
From: SHARP KABUSHIKI KAISHA
To: SHENZHEN TOREY MICROELECTRONIC TECHNOLOGY CO. LTD.
Reel/Frame 053754/0905 →