Patent Assignment
Reel/Frame 052355/0058
Assignment of Assignor's Interest
Recorded: 2020-04-09
Pages: 5
Assignors
EBIIKE, YUJI
Executed: 2020-02-20
NOGUCHI, TAKAYA
Executed: 2020-02-28
ITO, YOSHINORI
Executed: 2020-02-20
IKUTA, YOSHIKAZU
Executed: 2020-02-26
TAKAYAMA, KOICHI
Executed: 2020-02-20
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus, Semiconductor Device Test Method, and Semiconductor Device Manufacturing Method