IP Library Assignment 053027/0748
Patent Assignment
Reel/Frame 053027/0748

Assignment of Assignor's Interest

Recorded: 2020-06-24 Pages: 2
Assignor
LI, JIE
Executed: 2010-12-28
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Simultaneous Measurement of Multiple Overlay Errors Using Diffraction Based Overlay
Patent: 9,547,244 →
Application: 14/685,494 →
Publication: US 2015/0308817
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →