Patent Assignment
Reel/Frame 053164/0251
Assignment of Assignor's Interest
Recorded: 2020-07-09
Pages: 5
Assignors
TAKASU, HIROAKI
Executed: 2020-07-01
SERIZAWA, YOKO
Executed: 2020-07-03
SUZUKI, HIROYA
Executed: 2020-07-01
GOTO, SUMITAKA
Executed: 2020-07-06
Assignee
ABLIC INC.
3-9-6 MITA, MINATO-KU, TOKYO, 108-8330, JAPAN
Covered Property
(1)
Semiconductor Device and Method of Testing a Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.