Patent Assignment
Reel/Frame 053399/0776
Assignment of Assignor's Interest
Recorded: 2020-08-04
Pages: 5
Assignors
OHASHI, TAKEYOSHI
Executed: 2020-06-09
ABE, YUSUKE
Executed: 2020-06-10
TANIMOTO, KENJI
Executed: 2020-06-10
BIZEN, KAORI
Executed: 2020-07-01
KIM, HYEJIN
Executed: 2020-07-02
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Method for Measuring Pattern