IP Library › Assignment 053719/0630
Patent Assignment
Reel/Frame 053719/0630

Assignment of Assignor's Interest

Recorded: 2020-09-09 Pages: 4
Assignors
STICHTING VU
Executed: 2020-08-27
TENNER, VASCO TOMAS
Executed: 2020-08-25
Assignee
ASML NETHERLANDS B.V.
P.O. BOX 324, VELDHOVEN, 5500 AH, NETHERLANDS
Covered Property (1)
Metrology System and Method For Determining a Characteristic of One or More Structures on a Substrate
Application: 16/150,879 →
Publication: US 2019/0107781
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 7, 2020
From: TINNEMANS, PATRICIUS ALOYSIUS JACOBUS; DEN BOEF, ARIE JEFFREY; KOOLEN, ARMAND EUGENE ALBERT; PANDEY, NITESH
To: ASML NETHERLANDS B.V.
Reel/Frame 051437/0427 →
Assignment of Assignor's Interest Sep 9, 2020
From: STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN
To: ASML NETHERLANDS B.V.
Reel/Frame 053719/0647 →
Assignment of Assignor's Interest Sep 9, 2020
From: UNIVERSITEIT VAN AMSTERDAM
To: ASML NETHERLANDS B.V.
Reel/Frame 053719/0674 →