Patent Assignment
Reel/Frame 053779/0534
Assignment of Assignor's Interest
Recorded: 2020-09-15
Pages: 9
Assignors
JEANG, EUNHEE
Executed: 2020-08-19
AFINOGENOV, BORIS
Executed: 2020-08-30
BAE, SANGWOO
Executed: 2020-08-20
JOO, WONDON
Executed: 2020-08-19
RIABKO, MAKSIM
Executed: 2020-08-24
MEDVEDEV, ANTON
Executed: 2020-08-20
SHOROKHOV, ALEKSANDR
Executed: 2020-08-25
SOFRONOV, ANTON
Executed: 2020-08-24
KIM, INGI
Executed: 2020-08-20
KIM, TAEHYUN
Executed: 2020-08-24
SEO, MINHWAN
Executed: 2020-08-20
LEE, SANGMIN
Executed: 2020-08-20
LEE, SEULGI
Executed: 2020-08-24
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Substrate Inspection System and Method of Manufacturing Semiconductor Device Using Substrate Inspection System