Patent Assignment
Reel/Frame 053946/0321
Assignment of Assignor's Interest
Recorded: 2020-10-01
Pages: 4
Assignors
LIU, CHUN-TING
Executed: 2020-09-07
WU, WEN-LI
Executed: 2020-09-04
HE, BO-CHING
Executed: 2020-09-07
CHEN, GUO-DUNG
Executed: 2020-09-09
WU, SHENG-HSUN
Executed: 2020-09-07
FU, WEI-EN
Executed: 2020-09-07
Assignee
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
NO. 195, SEC. 4, CHUNG HSING RD., CHUTUNG, HSINCHU, 310401, TAIWAN
Covered Property
(1)
X-Ray Reflectometry Apparatus and Method Thereof for Measuring Three Dimensional Nanostructures on Flat Substrate
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.