Patent Assignment
Reel/Frame 055535/0001
Assignment of Assignor's Interest
Recorded: 2021-03-09
Pages: 3
Assignors
WEN, LANLIN
Executed: 2021-02-23
FENG, TIAN
Executed: 2021-02-23
ZHOU, ZHEN
Executed: 2021-02-23
Assignee
ZING SEMICONDUCTOR CORPORATION
NO. 1000, YUNSHUI RD., NICHENG TOWN, PUDONG NEW AREA, SHANGHAI, 201306, CHINA
Covered Property
(1)
Detection Method of Metal Impurity in Wafer