Patent Assignment
Reel/Frame 056469/0502
Assignment of Assignor's Interest
Recorded: 2021-06-08
Pages: 5
Assignor
ZENG, AN ANDREW
Executed: 2020-12-24
Assignee
NANJING LIAN SEMICONDUCTOR LIMITED
ROOM 1849, 99 TUANJIE ROAD, FUYINGDASHA, YANCHUANGYUAN, JIANGBEI NEW DISTRICT, NANJING, JIANGSU, CHINA
Covered Properties
(2)
Wafer Shape and Flatness Measurement Apparatus and Method
Tool Architecture for Wafer Geometry Measurement in Semiconductor Industry
Application:
17/272,115 →
Publication:
US 2021/0247178
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 15, 2022
From: NANJING LIAN SEMICONDUCTOR LIMITED
To: NANJING ZHONGAN SEMICONDUCTOR EQUIPMENT LTD
Reel/Frame 061435/0470 →
Assignment of Assignor's Interest
Dec 15, 2023
From: NANJING LIAN SEMICONDUCTOR LIMITED
To: NANJING ZHONGAN SEMICONDUCTOR EQUIPMENT LTD
Reel/Frame 065882/0212 →
Change of Name
Mar 5, 2026
From: NANJING ZHONGAN SEMICONDUCTOR EQUIPMENT LTD
To: JINGCHENG ZHONGAN SEMICONDUCTOR EQUIPMENT (BEIJING) LTD.
Reel/Frame 075019/0498 →