Patent Assignment
Reel/Frame 057370/0198
Change of Name
Recorded: 2021-09-02
Pages: 4
Assignor
HITACHI HIGH-TECHNOLOGIES CORPORATION
Executed: 2020-02-14
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Charged Particle Microscope Device and Wide-Field Image Generation Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.