Patent Assignment
Reel/Frame 057933/0535
Assignment of Assignor's Interest
Recorded: 2021-10-27
Pages: 7
Assignors
YOON, DOYOUNG
Executed: 2021-10-18
AHN, JEONGHO
Executed: 2021-10-18
LEE, DONGRYUL
Executed: 2021-10-18
IHM, DONGCHUL
Executed: 2021-10-18
JUN, CHUNGSAM
Executed: 2021-10-18
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU,, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Inspection System of Semiconductor Wafer and Method of Driving the Same