Patent Assignment
Reel/Frame 058029/0147
Assignment of Assignor's Interest
Recorded: 2021-11-04
Pages: 2
Assignors
TAKESHIMA, TOMOCHIKA
Executed: 2021-10-26
HIGUCHI, TAKAFUMI
Executed: 2021-10-26
HOTTA, KAZUHIRO
Executed: 2021-10-26
Assignee
HAMAMATSU PHOTONICS K.K.
1126-1, ICHINO-CHO, HIGASHI-KU, HAMAMATSU-SHI, SHIZUOKA, 435-8558, JAPAN
Covered Property
(1)
Method for Inspecting Semiconductor and Semiconductor Inspecting Device