IP Library › Assignment 058175/0622
Patent Assignment
Reel/Frame 058175/0622

Assignment of Assignor's Interest

Recorded: 2021-11-22 Pages: 11
Assignors
SAPUTRA, PUTRA
Executed: 2020-08-20
ELBATTAY, KHALID
Executed: 2020-09-07
DERWIN, PAUL
Executed: 2020-09-07
WERKMAN, ROY
Executed: 2020-08-11
JENSEN, ERIK
Executed: 2020-08-27
YU, HYUNWOO
Executed: 2020-08-17
SARMA, GAUTAM
Executed: 2020-09-07
Assignee
ASML NETHERLANDS B.V.
P.O. BOX 324, VELDHOVEN, 5500 AH, NETHERLANDS
Covered Property (1)
Method for Determining a Sampling Scheme, a Semiconductor Substrate Measurement Apparatus, a Lithographic Apparatus
Application: 17/612,601 →
Publication: US 2022/0260920
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 22, 2021
From: SMORENBERG, PIETER GERARDUS JACOBUS; SAPUTRA, PUTRA; ELBATTAY, KHALID; DERWIN, PAUL
To: ASML NETHERLANDS B.V.
Reel/Frame 058175/0639 →