Patent Assignment
Reel/Frame 058530/0154
Assignment of Assignor's Interest
Recorded: 2022-01-03
Pages: 2
Assignors
YAMAMOTO, MASAYA
Executed: 2021-10-21
HONDA, TOSHIFUMI
Executed: 2021-10-21
MAKUUCHI, MASAMI
Executed: 2021-10-21
OBARA, NOBUHIRO
Executed: 2021-10-25
MATSUMOTO, SHUNICHI
Executed: 2021-10-21
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6409, JAPAN
Covered Property
(1)
Defect Inspection Device and Defect Inspection Method