IP Library Assignment 059645/0791
Patent Assignment
Reel/Frame 059645/0791

Assignment of Assignor's Interest

Recorded: 2022-04-20 Pages: 4
Assignor
TAKEDA, AKIHIRO
Executed: 2020-06-30
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
X-Ray Inspection Apparatus and X-Ray Inspection Method
Application: 16/999,970 →
Publication: US 2021/0148837
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0593 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072913/0104 →