Patent Assignment
Reel/Frame 059877/0514
Assignment of Assignor's Interest
Recorded: 2022-05-10
Pages: 6
Assignors
KIM, MINSEOK
Executed: 2022-04-26
PARK, JUNYONG
Executed: 2022-04-26
KIM, DOOHYUN
Executed: 2022-04-26
PARK, ILHAN
Executed: 2022-04-25
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Reducing Reliability Degradation of Nonvolatile Memory Device, Nonvolatile Memory Device Using the Same and Method of Testing Nonvolatile Memory Device Using the Same