Patent Assignment
Reel/Frame 059892/0376
Assignment of Assignor's Interest
Recorded: 2022-05-11
Pages: 2
Assignors
YUMIBA, RYOU
Executed: 2021-12-10
SAKAI, KEI
Executed: 2021-12-10
YAMAGUCHI, SATORU
Executed: 2021-12-10
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure