Patent Assignment
Reel/Frame 059961/0343
Assignment of Assignor's Interest
Recorded: 2022-05-19
Pages: 2
Assignors
HIROI, TAKASHA
Executed: 2021-12-01
URANO, TAKAHIRO
Executed: 2021-12-13
HIROSE, NOBUAKI
Executed: 2021-12-09
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Method and Defect Inspection Device