Patent Assignment
Reel/Frame 060474/0695
Assignment of Assignor's Interest
Recorded: 2022-07-11
Pages: 7
Assignors
LEE, KYENHEE
Executed: 2022-06-10
KANG, MINCHEOL
Executed: 2022-05-16
LEE, SOORYONG
Executed: 2022-05-16
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Defect Detection Method of Deep Learning-Based Semiconductor Device and Semiconductor Element Manufacturing Method Including the Defect Detection Method