Patent Assignment
Reel/Frame 060754/0905
Assignment of Assignor's Interest
Recorded: 2022-08-09
Pages: 3
Assignors
PANG, LINYONG
Executed: 2022-08-08
BLAIR, JOCELYN
Executed: 2022-08-08
BARANWAL, AJAY
Executed: 2022-08-08
Assignee
D2S, INC.
4040 MOORPARK AVENUE #250, SAN JOSE, CALIFORNIA, 95117
Covered Property
(1)
Method for Computational Metrology and Inspection for Patterns to Be Manufactured on a Substrate