Patent Assignment
Reel/Frame 061217/0564
Assignment of Assignor's Interest
Recorded: 2022-09-26
Pages: 2
Assignor
KIKUCHI, TAKESHI
Executed: 2022-09-15
Assignee
TOPCON CORPORATION
75-1, HASUNUMA-CHO, ITABASHI-KU, TOKYO, 174-8580, JAPAN
Covered Property
(1)
Unevenness Level Inspecting Device, Unevenness Level Inspectiing System, and Unevenness Level Inspecting Method
Application:
17/952,931 →
Publication:
US 2023/0099546