Patent Assignment
Reel/Frame 061220/0263
Assignment of Assignor's Interest
Recorded: 2022-09-26
Pages: 10
Assignors
JIANG, YI
Executed: 2022-09-08
XIAO, DEYUAN
Executed: 2022-09-06
HAN, QINGHUA
Executed: 2022-09-07
TSAI, MENG-FENG
Executed: 2022-09-06
Assignee
CHANGXIN MEMORY TECHNOLOGIES, INC.
NO. 388, XINGYE AVENUE, AIRPORT INDUSTRIAL PARK, ECONOMIC AND TECHNOLOGICAL DEVELOPMENT AREA, HEFEI, ANHUI, 230601, CHINA
Covered Property
(1)
Test Structure and Method for Forming the Same, and Semiconductor Memory
Application:
17/935,572 →
Publication:
US 2023/0021007