Patent Assignment
Reel/Frame 061440/0341
Assignment of Assignor's Interest
Recorded: 2022-10-17
Pages: 3
Assignor
KASAHARA, HIRONORI
Executed: 2022-08-04
Assignee
OMRON CORPORATION
801, MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU, SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO-SHI, KYOTO, 600-8530, JAPAN
Covered Property
(1)
X-Ray Inspection Apparatus Used for an Inspection of a Substrate, X-Ray Inspection System, Image Management Method and Program