Patent Assignment
Reel/Frame 061788/0172
Assignment of Assignor's Interest
Recorded: 2022-11-16
Pages: 2
Assignors
SHIMASE, AKIRA
Executed: 2022-10-14
MAO, XIANGGUANG
Executed: 2022-10-14
UCHIKADO, AKIHITO
Executed: 2022-10-31
Assignee
HAMAMATSU PHOTONICS K.K.
1126-1, ICHINO-CHO, HIGASHI-KU, HAMAMATSU-SHI, SHIZUOKA, 435-8558, JAPAN
Covered Property
(1)
Semiconductor Inspecting Method and Semiconductor Inspecting Device