Patent Assignment
Reel/Frame 062263/0420
Assignment of Assignor's Interest
Recorded: 2023-01-03
Pages: 3
Assignee
NXP B.V.
HIGH TECH CAMPUS 60, EINDHOVEN, NL-5656 AG, NETHERLANDS
Covered Property
(1)
Test System for Detecting Faults in Multiple Devices of the Same Type
Application:
18/149,536 →
Publication:
US 2024/0219453