Patent Assignment
Reel/Frame 062325/0186
Assignment of Assignor's Interest
Recorded: 2023-01-10
Pages: 8
Assignors
KONDO, NAOAKI
Executed: 2022-12-06
DOI, YUKI
Executed: 2022-12-06
MIYAMOTO, ATSUSHI
Executed: 2022-12-06
NAKAYAMA, HIDEKI
Executed: 2022-12-07
KITSUKI, HIROHIKO
Executed: 2022-12-06
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6409, JAPAN
Covered Property
(1)
Defect Observation Method, Apparatus, and Program