Patent Assignment
Reel/Frame 062785/0889
Assignment of Assignor's Interest
Recorded: 2023-02-23
Pages: 6
Assignors
OH, MYEONGJIN
Executed: 2023-02-14
PARK, KYUNGJIN
Executed: 2023-02-14
CHOI, YONGSUK
Executed: 2023-02-14
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Device and Retention Test Method