Patent Assignment
Reel/Frame 063791/0750
Assignment of Assignor's Interest
Recorded: 2023-05-30
Pages: 7
Assignors
JEON, SEKYE
Executed: 2023-05-02
LEE, JINWOO
Executed: 2023-05-02
SUN, JONGCHEON
Executed: 2023-05-02
LEE, SUYOUNG
Executed: 2023-05-02
LEE, HYEONGCHEOL
Executed: 2023-05-25
JUN, CHUNGSAM
Executed: 2023-05-11
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU,, SUWON-SI, GYEONGGI-DO,, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Substrate Inspection Apparatus and Substrate Inspection Method